AD-332u8  [UHF RFID tag and inlay]

UHF RFID Inlay: AD-332u8

High reliability in high density, close proximity conditions

Industry segments: Apparel & Fashion, Logistics

AD-332u8 inlays from Avery Dennison Smartrac excel in high density, close proximity conditions often found in supply chain (inventory and logistics) and retail environments (apparel and item-level tagging). 

The Gen2 UHF RAIN RFID inlays have a 70 x 14.5mm antenna design providing superior bulk reading performance when tagged items are stacked, and feature UCODE 8 chips from NXP. The chip is equipped with 128 bits of EPC memory and a 96bit Tag IDentifier (TID) with a 48 bit unique serial number factory-encoded into the TID. 

Like all RFID products from Avery Dennison Smartrac, AD-332u8 inlays are manufactured according to the industry's highest quality standards, as confirmed by the RFID Lab at Auburn University: The inspection body awarded Avery Dennison its first comprehensive and significant ARC accreditation for quality.

Technical features
Frequency Band
UHF 860 - 960 MHz
Antenna Dimensions 70 x 15 mm / 2.76 x 0.57 in
Die Cut Dimensions 76 x 20 mm / 3.00 x 0.80 in
EPC Memory 128 bits
TID Memory 96-Bit Tag IDentifier & 48-Bit
Product Code Wet inlay RF601319 / IL-603774
Label / sticker RF100638 / IL-603775

Please find a comprehensive overview of all features in the data sheet.

Related content

Quick guide:
RFID labels for Apparel

Avery Dennison Smartrac offers the broadest product range for any RFID challenge and ensures consistent quality and performance. Check our RFID product recommendations for the Apparel industry segment.

Avery Dennison introduces AD-332u8 RAIN RFID inlay that excels in high density, close proximity conditions

Avery Dennison announced that the AD-332u8 inlay has passed the ARC category H requirements for demanding retail environments. Having launched in 2019 prior to the category H specifications coming into force, this is the first inlay in the market with proven high volume deployments. AD-332u8 offers superior reliability in high density, close proximity conditions.

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